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The Fastest Wide Bandgap
Semiconductor Testers

ipTEST makes the MOSTRAK series of testers — the fastest, most powerful, and complete production line testers for power discrete MOS, IGBT, SiC, GaN, and bipolar devices.

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🏆 Winner: 2023 & 2024 King’s Award for Enterprise 🔧 30+ Years of Semiconductor Testing Innovation

About ipTEST

ipTEST is a leading developer and manufacturer of high-volume production testers for all types of discrete power semiconductors. We focus on enabling our customers to bring to market the most efficient power switching devices, helping drive more efficient power control and reduce environmental impact.

ipTEST Engineering Team

As part of the Microtest global group, ipTEST stands at the forefront of innovation and flexibility in power testing solutions. Based in the UK, we specialize in developing test systems for next-generation technologies like Gallium Nitride (GaN) and Silicon Carbide (SiC), as well as advanced MOSFETs, IGBTs, diodes, SCRs, and bipolar transistors.

With over 500 Mostrak and M2 systems installed globally, our customers rely on ipTEST for 100% production testing to ensure reliability in automotive, industrial, and power conversion applications.

ISO 2022 Award

ISO 9001 Certified

25+ years of continuous registration

Our Products

Built on 30+ years of testing expertise, ipTEST’s M2 and MOSTRAK platforms deliver high throughput, accuracy, and comprehensive test coverage in a compact footprint — ideal for modern wide bandgap semiconductors.

Mostrak-2 (M2)

Mostrak-2 (M2)

High-speed modular platform for back-end and wafer testing of SiC, GaN, and power discretes.

M2 Rotary Turret Edition

M2 Rotary Turret Edition

Optimized for high-throughput final test with rotary indexing for maximum efficiency.

M2 DS6 Pulsar

M2 DS6 Pulsar

Advanced dynamic switching module for fast transient and UIS testing.

Dynamic Switching

Dynamic Switching

High-speed switching characterization for power MOSFETs and IGBTs.

Unclamped Inductive Switching (UIS)

UIS Testing

Robust avalanche stress testing for ruggedness validation of power devices.

Power Characterization Test

Power Characterization

Comprehensive parametric and functional testing for R&D and production.

Known Good Die (KGD)

Known Good Die (KGD)

Wafer-level testing to ensure die reliability before packaging.

MOSTRAK Series

MOSTRAK Series

Legacy and next-gen testers with full backward compatibility and scalability.

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Advanced Testing Capabilities

ipTEST systems provide the most comprehensive test coverage for power electronics, supporting static, avalanche, and dynamic switching tests across wafer, KGD, final test, and lab environments.

Static Parametric Testing

Threshold voltage, leakage, on-resistance, capacitance, and more — with high accuracy and repeatability.

Dynamic Switching

High-speed switching characterization including turn-on/off times, gate charge, and switching losses.

Unclamped Inductive Switching (UIS)

Avalanche ruggedness testing to validate device reliability under extreme conditions.

Wafer & KGD Testing

Full parametric screening at wafer level to ensure only known good die proceed to packaging.

Back-End Final Test

High-throughput final test with handler integration, automation, and part-average testing (PAT).

Laboratory & R&D Testing

Flexible, modular systems ideal for characterization, failure analysis, and new product development.

Why Choose ipTEST?

High Speed

Fastest testers in the world for wide bandgap semiconductors.

Reliability

Trusted by leading IDMs for 100% production testing.

Modular Design

Flexible configurations for handlers, probers, and automation.

Comprehensive Coverage

Static, dynamic, avalanche, and parametric testing in one platform.

500+

Testers Installed

30+

Years of Innovation

25+

Years ISO 9001 Certified

2x

King’s Award Winner

Frequently Asked Questions

What devices can ipTEST systems test?

Our testers support power MOSFETs, IGBTs, SiC, GaN, diodes, SCRs, and bipolar transistors across wafer, KGD, and final test stages.

Are ipTEST systems suitable for high-volume production?

Yes. The M2 platform is designed for high throughput with handler integration, automation, and part-average testing (PAT) for production environments.

Do you support GaN and SiC testing?

Absolutely. Our systems are optimized for wide bandgap semiconductors with high-speed switching and dynamic test capabilities.

Is technical support available globally?

Yes. We provide global support through our network of technical sales and service engineers.

Get in Touch

For product inquiries, technical support, or partnership opportunities, visit our official website to contact ipTEST.

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